Your search returned 9 records. Click on the hyperlinks to view further details of Titles..

 

Magazine Name : Microelectronics Journal

Year : 2003 Volume number : 34 Issue: 01

Scan Flip-Flops With On-Line Testing Ability With Respect To Input Dealy And Crosstalk Faults (Article)
Subject: On-Line Testing
Author: C Metra     
page:      24 - 30
Parallel Testing Of Multi-Port Static Random Access Memories (Article)
Subject: Memory Testing , Embedded Memories
Author: F Karimi     
page:      3 - 22
Concurrent Error Detection Of Fault-Based Side-Channel Cryptanalysis Of 128-Bit Rc6 Block Cipher (Article)
Subject: Concurrent Error Detection , Cryptanalysis
Author: Kaijie Wu     
page:      31 - 40
Study, Comparison And Applicantion Of Different Vhdl-Based Fault Injection Tecniques For The Experimental Validation Of A Fault-Tolerant System (Article)
Subject: Dependability , Validation
Author: D Gil     
page:      41 - 52
New Techniques For Efficiently Assessing Relibility Of Socs (Article)
Subject: System-On-A-Chip , Single Event Upset
Author: P Civera     
page:      53 - 62
The Measurement Of The Dielectric And Optical Properties Of Nano Thin Film S By Thz Differential Time-Domain Spectroscopy (Article)
Subject: Thz Differential Time-Domain Spectroscopy , Thin Film
Author: Kwang-Su Lee     
page:      63 - 69
Numerical Investigation Of Characteristucs P-Channel Ge/Si Hetero-Nanocystal Memory (Article)
Subject: Ge/Si , Nanocrystal , Memory
Author: H.G Yang     
page:      71 - 76
Extraction Techniqu For Characterization Of Electric Field Distribution And Drain Current In Vdmos Power Transistor (Article)
Subject: Silicon Vdmos , Power Mosfet
Author: N Kaushik     
page:      77 - 84
Analog Signal Generator For Bist Of Weband If Signals Bandpass Sigma-Delta Modulator (Article)
Subject: Digital Intermediate Frequency
Author: Feng Huang     
page:      - - -